It is well known that topological insulators have topologically protected
conducting surface states. In some cases, these materials can also host
conducting pathways via bulk defects such as twin boundaries and
dislocations. Our goal is to study the unique properties of the topological
matter forming around extended defects. Observing these conducting
paths can be highly challenging due to the presence of other transport
paths. In this talk, I will summarize our strategies to characterize
conduction via defects in a variety of topological materials, such as
(Bi1−xSbx)2Te3, SmB6, and BiSb alloys